Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | European Microwave Week 2010, EuMW2010 |
| Untertitel | Connecting the World, Conference Proceedings - European Wireless Technology Conference, EuWiT 2010 |
| Seiten | 277-280 |
| Seitenumfang | 4 |
| Publikationsstatus | Veröffentlicht - 27 Sept. 2010 |
| Veranstaltung | 3rd European Wireless Technology Conference, EuWiT 2010 - Paris, Frankreich Dauer: 27 Sept. 2010 → 28 Sept. 2010 |
Publikationsreihe
| Name | European Wireless Technology Conference |
|---|---|
| ISSN (Print) | 2153-3644 |
| ISSN (elektronisch) | 2153-3652 |
Abstract
This paper presents a new testbed for measuring the impedance of planar symmetrically RFID antennas. The measurement setup consists of an impedance analyzer, a balun, a special probe for contacting the antenna as well as an anechoic chamber. To verify the proposed testbed, the impedances of two antennas were simulated and compared to measurement results obtained by the testbed. Furthermore measurement results with a wafer probe setup are presented. It is shown that commonly used wafer prober measurements are inherently limited in their accuracy. An excellent agreement between simulation and measurement is achieved with the proposed testbed.
ASJC Scopus Sachgebiete
- Informatik (insg.)
- Computernetzwerke und -kommunikation
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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European Microwave Week 2010, EuMW2010: Connecting the World, Conference Proceedings - European Wireless Technology Conference, EuWiT 2010. 2010. S. 277-280 5615117 ( European Wireless Technology Conference).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - A testbed for precision impedance measurements of planar symmetrical RFID antennas
AU - Meyer, Johannes
AU - Herschmann, R.
AU - Geck, B.
PY - 2010/9/27
Y1 - 2010/9/27
N2 - This paper presents a new testbed for measuring the impedance of planar symmetrically RFID antennas. The measurement setup consists of an impedance analyzer, a balun, a special probe for contacting the antenna as well as an anechoic chamber. To verify the proposed testbed, the impedances of two antennas were simulated and compared to measurement results obtained by the testbed. Furthermore measurement results with a wafer probe setup are presented. It is shown that commonly used wafer prober measurements are inherently limited in their accuracy. An excellent agreement between simulation and measurement is achieved with the proposed testbed.
AB - This paper presents a new testbed for measuring the impedance of planar symmetrically RFID antennas. The measurement setup consists of an impedance analyzer, a balun, a special probe for contacting the antenna as well as an anechoic chamber. To verify the proposed testbed, the impedances of two antennas were simulated and compared to measurement results obtained by the testbed. Furthermore measurement results with a wafer probe setup are presented. It is shown that commonly used wafer prober measurements are inherently limited in their accuracy. An excellent agreement between simulation and measurement is achieved with the proposed testbed.
UR - http://www.scopus.com/inward/record.url?scp=78649937734&partnerID=8YFLogxK
M3 - Conference contribution
AN - SCOPUS:78649937734
SN - 9782874870187
T3 - European Wireless Technology Conference
SP - 277
EP - 280
BT - European Microwave Week 2010, EuMW2010
T2 - 3rd European Wireless Technology Conference, EuWiT 2010
Y2 - 27 September 2010 through 28 September 2010
ER -