Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | 2015 IEEE International Symposium on Electromagnetic Compatibility |
| Untertitel | EMC |
| Herausgeber (Verlag) | Institute of Electrical and Electronics Engineers Inc. |
| Seiten | 1077-1082 |
| Seitenumfang | 6 |
| ISBN (elektronisch) | 9781479966158 |
| Publikationsstatus | Veröffentlicht - 2015 |
| Veranstaltung | IEEE International Symposium on Electromagnetic Compatibility, EMC 2015 - Dresden, Deutschland Dauer: 16 Aug. 2015 → 22 Aug. 2015 |
Publikationsreihe
| Name | IEEE International Symposium on Electromagnetic Compatibility |
|---|---|
| Band | 2015-Septmber |
| ISSN (Print) | 1077-4076 |
| ISSN (elektronisch) | 2158-1118 |
Abstract
This paper introduces a procedural method for the systematic risk analysis when an IT-System is exposed to an intentional electromagnetic environment (IEME). The method analyzes the susceptibility of an electronic system with the respect to intentional electromagnetic interferences (IEMI). It combines the advantage of fault tree analysis (FTA), electromagnetic topology (EMT) and Bayesian networks (BN) and enhance the statistical-based models for the coupling and the system behavior with uncertain data. The fuzzy approach in this paper adds to the statistical and crisp data, the uncertainness with linguistic terms. That terms treat the predication for that crisp data not exist or only reach with the utmost effort. In a final step the critical scenario are identify and the elements which contribute most to the risk.
ASJC Scopus Sachgebiete
- Physik und Astronomie (insg.)
- Physik der kondensierten Materie
- Ingenieurwesen (insg.)
- Elektrotechnik und Elektronik
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- BibTex
- RIS
2015 IEEE International Symposium on Electromagnetic Compatibility: EMC. Institute of Electrical and Electronics Engineers Inc., 2015. S. 1077-1082 7256318 (IEEE International Symposium on Electromagnetic Compatibility; Band 2015-Septmber).
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung › Peer-Review
}
TY - GEN
T1 - A Fuzzy Approach for IEMI Risk Analysis of IT-Systems with Respect to Transient Disturbances
AU - Peikert, Tim
AU - Garbe, Heyno
AU - Potthast, Stefan
PY - 2015
Y1 - 2015
N2 - This paper introduces a procedural method for the systematic risk analysis when an IT-System is exposed to an intentional electromagnetic environment (IEME). The method analyzes the susceptibility of an electronic system with the respect to intentional electromagnetic interferences (IEMI). It combines the advantage of fault tree analysis (FTA), electromagnetic topology (EMT) and Bayesian networks (BN) and enhance the statistical-based models for the coupling and the system behavior with uncertain data. The fuzzy approach in this paper adds to the statistical and crisp data, the uncertainness with linguistic terms. That terms treat the predication for that crisp data not exist or only reach with the utmost effort. In a final step the critical scenario are identify and the elements which contribute most to the risk.
AB - This paper introduces a procedural method for the systematic risk analysis when an IT-System is exposed to an intentional electromagnetic environment (IEME). The method analyzes the susceptibility of an electronic system with the respect to intentional electromagnetic interferences (IEMI). It combines the advantage of fault tree analysis (FTA), electromagnetic topology (EMT) and Bayesian networks (BN) and enhance the statistical-based models for the coupling and the system behavior with uncertain data. The fuzzy approach in this paper adds to the statistical and crisp data, the uncertainness with linguistic terms. That terms treat the predication for that crisp data not exist or only reach with the utmost effort. In a final step the critical scenario are identify and the elements which contribute most to the risk.
KW - decision making under risk
KW - Electromagnetic (EM) effects
KW - fuzzy events
KW - fuzzy probabilities
KW - intentional electromagnetic interference (IEMI)
KW - probabilistic risk analysis
UR - http://www.scopus.com/inward/record.url?scp=84953848949&partnerID=8YFLogxK
U2 - 10.1109/ISEMC.2015.7256318
DO - 10.1109/ISEMC.2015.7256318
M3 - Conference contribution
AN - SCOPUS:84953848949
T3 - IEEE International Symposium on Electromagnetic Compatibility
SP - 1077
EP - 1082
BT - 2015 IEEE International Symposium on Electromagnetic Compatibility
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - IEEE International Symposium on Electromagnetic Compatibility, EMC 2015
Y2 - 16 August 2015 through 22 August 2015
ER -