A Combination of Ion Implantation and High-Temperature Annealing: Donor–Acceptor Pairs in Carbon-Implanted AlN

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Autoren

  • Lukas Peters
  • Hendrik Spende
  • Stefan Wolter
  • Christoph Margenfeld
  • Carsten Ronning
  • Tobias Voss
  • Andreas Waag

Externe Organisationen

  • Technische Universität Braunschweig
  • Friedrich-Schiller-Universität Jena
Forschungs-netzwerk anzeigen

Details

OriginalspracheEnglisch
Aufsatznummer2200809
FachzeitschriftPhysica Status Solidi (A) Applications and Materials Science
Jahrgang220
Ausgabenummer16
Frühes Online-Datum14 Feb. 2023
PublikationsstatusVeröffentlicht - 18 Aug. 2023
Extern publiziertJa

Abstract

Herein, carbon-implanted high-temperature annealed (HTA) AlN layers are analyzed and donor–acceptor pair (DAP) transitions probably between the two most abundant impurities, carbon and oxygen, are identified. Both are regarded as the main, hard-to-avoid impurities in crystal growth. Oxygen is believed to lead to absorption in the deep UV below a wavelength of 250 nm. In contrast, carbon is the most likely candidate to be responsible for a distinct absorption band around 265 nm. This interpretation has recently been challenged. In this study, carbon-implanted and HTA AlN layers with ion fluences above 8.1 × 1015 cm−2 are analyzed using low-temperature and time-resolved cathodoluminescence spectroscopy. Due to the high concentration of oxygen inside the AlN, as a result of the HTA process, a DAP transition between a most likely carbon-related acceptor and ON is observed. The measured temperature- and power-dependent blueshift of the peak emission energy as well as the luminescence transients can be clearly explained by a continuous change from a DAP transition at low temperature to a free electron to acceptor transition with increasing temperature. The findings are supported by a configurational coordinate model that describes the measured behavior qualitatively.

ASJC Scopus Sachgebiete

Zitieren

A Combination of Ion Implantation and High-Temperature Annealing: Donor–Acceptor Pairs in Carbon-Implanted AlN. / Peters, Lukas; Spende, Hendrik; Wolter, Stefan et al.
in: Physica Status Solidi (A) Applications and Materials Science, Jahrgang 220, Nr. 16, 2200809, 18.08.2023.

Publikation: Beitrag in FachzeitschriftArtikelForschungPeer-Review

Peters L, Spende H, Wolter S, Margenfeld C, Ronning C, Voss T et al. A Combination of Ion Implantation and High-Temperature Annealing: Donor–Acceptor Pairs in Carbon-Implanted AlN. Physica Status Solidi (A) Applications and Materials Science. 2023 Aug 18;220(16):2200809. Epub 2023 Feb 14. doi: 10.1002/pssa.202200809
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abstract = "Herein, carbon-implanted high-temperature annealed (HTA) AlN layers are analyzed and donor–acceptor pair (DAP) transitions probably between the two most abundant impurities, carbon and oxygen, are identified. Both are regarded as the main, hard-to-avoid impurities in crystal growth. Oxygen is believed to lead to absorption in the deep UV below a wavelength of 250 nm. In contrast, carbon is the most likely candidate to be responsible for a distinct absorption band around 265 nm. This interpretation has recently been challenged. In this study, carbon-implanted and HTA AlN layers with ion fluences above 8.1 × 1015 cm−2 are analyzed using low-temperature and time-resolved cathodoluminescence spectroscopy. Due to the high concentration of oxygen inside the AlN, as a result of the HTA process, a DAP transition between a most likely carbon-related acceptor and ON is observed. The measured temperature- and power-dependent blueshift of the peak emission energy as well as the luminescence transients can be clearly explained by a continuous change from a DAP transition at low temperature to a free electron to acceptor transition with increasing temperature. The findings are supported by a configurational coordinate model that describes the measured behavior qualitatively.",
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T1 - A Combination of Ion Implantation and High-Temperature Annealing: Donor–Acceptor Pairs in Carbon-Implanted AlN

AU - Peters, Lukas

AU - Spende, Hendrik

AU - Wolter, Stefan

AU - Margenfeld, Christoph

AU - Ronning, Carsten

AU - Voss, Tobias

AU - Waag, Andreas

N1 - Publisher Copyright: © 2023 The Authors. physica status solidi (a) applications and materials science published by Wiley-VCH GmbH.

PY - 2023/8/18

Y1 - 2023/8/18

N2 - Herein, carbon-implanted high-temperature annealed (HTA) AlN layers are analyzed and donor–acceptor pair (DAP) transitions probably between the two most abundant impurities, carbon and oxygen, are identified. Both are regarded as the main, hard-to-avoid impurities in crystal growth. Oxygen is believed to lead to absorption in the deep UV below a wavelength of 250 nm. In contrast, carbon is the most likely candidate to be responsible for a distinct absorption band around 265 nm. This interpretation has recently been challenged. In this study, carbon-implanted and HTA AlN layers with ion fluences above 8.1 × 1015 cm−2 are analyzed using low-temperature and time-resolved cathodoluminescence spectroscopy. Due to the high concentration of oxygen inside the AlN, as a result of the HTA process, a DAP transition between a most likely carbon-related acceptor and ON is observed. The measured temperature- and power-dependent blueshift of the peak emission energy as well as the luminescence transients can be clearly explained by a continuous change from a DAP transition at low temperature to a free electron to acceptor transition with increasing temperature. The findings are supported by a configurational coordinate model that describes the measured behavior qualitatively.

AB - Herein, carbon-implanted high-temperature annealed (HTA) AlN layers are analyzed and donor–acceptor pair (DAP) transitions probably between the two most abundant impurities, carbon and oxygen, are identified. Both are regarded as the main, hard-to-avoid impurities in crystal growth. Oxygen is believed to lead to absorption in the deep UV below a wavelength of 250 nm. In contrast, carbon is the most likely candidate to be responsible for a distinct absorption band around 265 nm. This interpretation has recently been challenged. In this study, carbon-implanted and HTA AlN layers with ion fluences above 8.1 × 1015 cm−2 are analyzed using low-temperature and time-resolved cathodoluminescence spectroscopy. Due to the high concentration of oxygen inside the AlN, as a result of the HTA process, a DAP transition between a most likely carbon-related acceptor and ON is observed. The measured temperature- and power-dependent blueshift of the peak emission energy as well as the luminescence transients can be clearly explained by a continuous change from a DAP transition at low temperature to a free electron to acceptor transition with increasing temperature. The findings are supported by a configurational coordinate model that describes the measured behavior qualitatively.

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