3-dimensional simulations of temperature and current density distribution in a via structure

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OriginalspracheEnglisch
Titel des SammelwerksAnnual Proceedings - Reliability Physics (Symposium)
Seiten361-365
Seitenumfang5
PublikationsstatusVeröffentlicht - 1992
Veranstaltung30th Annual International Reliability Physics Symposium - San Diego, CA, USA
Dauer: 31 März 19922 Apr. 1992

Publikationsreihe

NameAnnual Proceedings - Reliability Physics (Symposium)
ISSN (Print)0099-9512

Abstract

The influence of geometry (overlap, step coverage, filling ratio) and filling material on temperature and current density distributions in via structures of different forms and technologies simulated with the finite element method program ANSYS was studied. Vias of square, circular, and oval forms were investigated. The influence of via filling was observed. Reduction of current crowding and self-heating effects were found for the tungsten-filled via. Critical parameters for the filling materials were determined. Local temperature and current density distributions are shown.

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3-dimensional simulations of temperature and current density distribution in a via structure. / Weide, K.; Hasse, W.
Annual Proceedings - Reliability Physics (Symposium). 1992. S. 361-365 (Annual Proceedings - Reliability Physics (Symposium)).

Publikation: Beitrag in Buch/Bericht/Sammelwerk/KonferenzbandAufsatz in KonferenzbandForschungPeer-Review

Weide, K & Hasse, W 1992, 3-dimensional simulations of temperature and current density distribution in a via structure. in Annual Proceedings - Reliability Physics (Symposium). Annual Proceedings - Reliability Physics (Symposium), S. 361-365, 30th Annual International Reliability Physics Symposium, San Diego, CA, USA, 31 März 1992. https://doi.org/10.1109/relphy.1992.187670
Weide, K., & Hasse, W. (1992). 3-dimensional simulations of temperature and current density distribution in a via structure. In Annual Proceedings - Reliability Physics (Symposium) (S. 361-365). (Annual Proceedings - Reliability Physics (Symposium)). https://doi.org/10.1109/relphy.1992.187670
Weide K, Hasse W. 3-dimensional simulations of temperature and current density distribution in a via structure. in Annual Proceedings - Reliability Physics (Symposium). 1992. S. 361-365. (Annual Proceedings - Reliability Physics (Symposium)). doi: 10.1109/relphy.1992.187670
Weide, K. ; Hasse, W. / 3-dimensional simulations of temperature and current density distribution in a via structure. Annual Proceedings - Reliability Physics (Symposium). 1992. S. 361-365 (Annual Proceedings - Reliability Physics (Symposium)).
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