Details
| Originalsprache | Englisch |
|---|---|
| Titel des Sammelwerks | Proceedings |
| Untertitel | XII. International Colloquium on Surfaces : Januar 28th and 29th, 2008, Germany, Chemnitz |
| Herausgeber/-innen | Michael Dietzsch |
| Erscheinungsort | Aachen |
| Seitenumfang | 8 |
| Publikationsstatus | Veröffentlicht - 2008 |
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3D Surface Measurement by Low Voltage Scanning Electron Microscope. / Vynnyk, T.; Seewig, J.; Reithmeier, E.
Proceedings: XII. International Colloquium on Surfaces : Januar 28th and 29th, 2008, Germany, Chemnitz. Hrsg. / Michael Dietzsch. Aachen, 2008.
Proceedings: XII. International Colloquium on Surfaces : Januar 28th and 29th, 2008, Germany, Chemnitz. Hrsg. / Michael Dietzsch. Aachen, 2008.
Publikation: Beitrag in Buch/Bericht/Sammelwerk/Konferenzband › Aufsatz in Konferenzband › Forschung
Vynnyk, T, Seewig, J & Reithmeier, E 2008, 3D Surface Measurement by Low Voltage Scanning Electron Microscope. in M Dietzsch (Hrsg.), Proceedings: XII. International Colloquium on Surfaces : Januar 28th and 29th, 2008, Germany, Chemnitz. Aachen. <https://www.imr.uni-hannover.de/index.php?eID=tx_securedownloads&p=89&u=0&g=0&t=1605079090&hash=59163ce481ad65e931557f0dd67420aa18616136&file=/uploads/tx_tkpublikationen/XII_ICS-vynnyk_release_2008.pdf>
Vynnyk, T., Seewig, J., & Reithmeier, E. (2008). 3D Surface Measurement by Low Voltage Scanning Electron Microscope. In M. Dietzsch (Hrsg.), Proceedings: XII. International Colloquium on Surfaces : Januar 28th and 29th, 2008, Germany, Chemnitz https://www.imr.uni-hannover.de/index.php?eID=tx_securedownloads&p=89&u=0&g=0&t=1605079090&hash=59163ce481ad65e931557f0dd67420aa18616136&file=/uploads/tx_tkpublikationen/XII_ICS-vynnyk_release_2008.pdf
Vynnyk T, Seewig J, Reithmeier E. 3D Surface Measurement by Low Voltage Scanning Electron Microscope. in Dietzsch M, Hrsg., Proceedings: XII. International Colloquium on Surfaces : Januar 28th and 29th, 2008, Germany, Chemnitz. Aachen. 2008
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@inproceedings{766a2e14ab444c87a89cd247843dcba6,
title = "3D Surface Measurement by Low Voltage Scanning Electron Microscope",
author = "T. Vynnyk and J. Seewig and E. Reithmeier",
year = "2008",
language = "English",
isbn = "978-3-8322-6912-8",
editor = "Michael Dietzsch",
booktitle = "Proceedings",
}
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TY - GEN
T1 - 3D Surface Measurement by Low Voltage Scanning Electron Microscope
AU - Vynnyk, T.
AU - Seewig, J.
AU - Reithmeier, E.
PY - 2008
Y1 - 2008
M3 - Conference contribution
SN - 978-3-8322-6912-8
BT - Proceedings
A2 - Dietzsch, Michael
CY - Aachen
ER -