A Probability Soft-Error Model for a 28-nm SRAM-based FPGA under Neutron Radiation Exposure

Thieu, G. B., Schmechel, J., Weide-Zaage, K., Schmidt, K., Hagenah, D. & Paya-Vaya, G., 2023, 2023 24th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems: EuroSimE . Institute of Electrical and Electronics Engineers Inc., ( International Conference on Thermal, Mechanical and Multi-physics Simulation and Experiments in Microelectronics and Microsystems).

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DoA Estimation in Automotive MIMO Radar With Sparse Array via Fast Variational Bayesian Method

Jauch, A., Meinl, F. & Blume, H., 2023, 2023 IEEE Conference on Antenna Measurements and Applications, CAMA 2023. Institute of Electrical and Electronics Engineers Inc., S. 892-897 6 S. (IEEE Conference on Antenna Measurements and Applications, CAMA).

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Exploiting Subword Permutations to Maximize CNN Compute Performance and Efficiency

Beyer, M., Gesper, S., Guntoro, A., Paya-Vaya, G. & Blume, H., 2023, Proceedings - 2023 IEEE 34th International Conference on Application-Specific Systems, Architectures and Processors, ASAP 2023. Institute of Electrical and Electronics Engineers Inc., S. 61-68 8 S. (Proceedings of the International Conference on Application-Specific Systems, Architectures and Processors; Band 2023-July).

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Fault Detection Mechanisms for COTS FPGA Systems Used in Low Earth Orbit

Oberschulte, T., Marten, J. & Blume, H., 2023, Embedded Computer Systems: Architectures, Modeling, and Simulation - 23rd International Conference, SAMOS 2023, Proceedings. Silvano, C., Reichenbach, M. & Pilato, C. (Hrsg.). Springer International Publishing AG, S. 19-32 14 S. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); Band 14385 LNCS).

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High Performance Instruction Fetch Structure within a RISC-V Processor for Use in Harsh Environments

Hawich, M., Rumpeltin, N. (Mitwirkende*r), Rücker, M. (Mitwirkende*r), Stuckenberg, T. (Mitwirkende*r) & Blume, H., 2023, Lecture Notes in Computer Science: Embedded Computer Systems: Architectures, Modeling, and Simulation 23rd International Conference, SAMOS 2023 Samos, Greece, July 2–6, 2023 Proceedings. Silvano, C., Reichenbach, M. & Pilato, C. (Hrsg.). Band 23. S. 255-268 14 S. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); Band 14385 LNCS).

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Improved Multi-Scale Grid Rendering of Point Clouds for Radar Object Detection Networks

Köhler, D., Quach, M., Ulrich, M., Meinl, F., Bischoff, B. & Blume, H., 2023, 2023 26th International Conference on Information Fusion, FUSION 2023.

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N²V²PRO: Neural Network Mapping Framework for a Custom Vector Processor Architecture

Gesper, S., Thieu, G. B., Kohler, D., Kock, M., Berthold, T., Renke, O., Blume, H. & Paya-Vaya, G., 2023, 2023 IEEE 13th International Conference on Consumer Electronics - Berlin, ICCE-Berlin 2023. IEEE Computer Society, S. 94-99 6 S. (IEEE International Conference on Consumer Electronics - Berlin, ICCE-Berlin).

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Online Quantization Adaptation for Fault-Tolerant Neural Network Inference

Beyer, M., Borrmann, J. M., Guntoro, A. & Blume, H., 2023, Computer Safety, Reliability, and Security: 42nd International Conference, SAFECOMP 2023, Toulouse, France, September 20–22, 2023, Proceedings. Guiochet, J., Tonetta, S. & Bitsch, F. (Hrsg.). Springer International Publishing AG, S. 243–256 14 S. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); Band 14181 LNCS).

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Stability Analysis for Frequency Tunable Bandpass Delta-Sigma ADC Architectures

Flemming, J., Wicht, B. & Witte, P., 2023, Proceedings - 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2023. Institute of Electrical and Electronics Engineers Inc., (Proceedings - 2023 19th International Conference on Synthesis, Modeling, Analysis and Simulation Methods, and Applications to Circuit Design, SMACD 2023).

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The ZuSE-KI-Mobil AI Accelerator SoC: Overview and a Functional Safety Perspective

Kempf, F., Hoefer, J., Harbaum, T., Becker, J., Fasfous, N., Frickenstein, A., Voegel, H. J., Friedrich, S., Wittig, R., Matúš, E., Fettweis, G., Lueders, M., Blume, H., Benndorf, J., Grantz, D., Zeller, M., Engelke, D. & Eickel, K. H., 2023, 2023 Design, Automation and Test in Europe Conference and Exhibition, DATE 2023 - Proceedings. Institute of Electrical and Electronics Engineers Inc., (Proceedings -Design, Automation and Test in Europe, DATE; Band 2023-April).

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The ΔV-Method: An Intuitive Method for Analyzing Soft-Charging Capabilities of Hybrid Switched-Capacitor DC-DC Converters

Henriksen, M. M., Otten, J., Gehl, A. & Wicht, B., 2023, 2023 IEEE 24th Workshop on Control and Modeling for Power Electronics (COMPEL). S. 1-6 6 S.

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TID and DSEE Effects in a GaN FET Capable PWM Controller IC Prototype for Space Applications

Mand, P., Burkhay, V., Rocke, A., Gieselmann, U., Fauth, L., Olbrich, M., Oliver, J., Wicht, B. & Friebe, J., 2023, 2023 13th European Space Power Conference, ESPC 2023. Institute of Electrical and Electronics Engineers Inc.

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TID and DSEE Effects in a Hi-Rel Point-of-Load IC Prototype for Space Applications

Mand, P., Burkhay, V., Rocke, A., Gieselmann, U., Fauth, L., Olbrich, M., Delepaut, C., Wicht, B. & Friebe, J., 2023, 2023 13th European Space Power Conference, ESPC 2023. Institute of Electrical and Electronics Engineers Inc.

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TID and DSEE Effects in a Voltage Clamp IC Prototype for Space Applications

Mand, P., Burkhay, V., Rocke, A., Gieselmann, U., Fauth, L., Olbrich, M., Beister, J., Landstrom, S., Tonicello, F., Wicht, B. & Friebe, J., 2023, 2023 13th European Space Power Conference, ESPC 2023. Institute of Electrical and Electronics Engineers Inc.

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ZuSE KI-AVF: Application-Specific AI Processor for Intelligent Sensor Signal Processing in Autonomous Driving

Thieu, G. B., Gesper, S., Payá-Vayá, G., Riggers, C., Renke, O., Fiedler, T. N., Marten, J., Stuckenberg, T., Blume, H., Weis, C., Steinert, L., Sudarshan, C., Wehn, N., Reimann, L. M., Leupers, R., Beyer, M., Köhler, D., Jauch, A., Borrmann, J. M., Jaberansari, S., Berthold, T., Blawat, M., Kock, M., Schewior, G., Benndorf, J., Kautz, F., Bluethgen, H. & Sauer, C., 2023, 2023 Design, Automation and Test in Europe Conference and Exhibition, DATE 2023 - Proceedings. (Design, automation and test in Europe conference).

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