Refractive index of DOWSIL EI-1184

Dataset: DatensatzDataset

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Details

Datum der Bereitstellung31 Juli 2024
Herausgeber (Verlag)Forschungsdaten-Repositorium der LUH
AnsprechpersonArved Ziebehl

Beschreibung

Refractive index measurements were performed on the transparent RTV2-silicone DOWSIL EI-1184 using a prism spectrometer. The experimental setup and its according variables are provided in 'experimental_setup_prism_spectrometer.png'. Three mixing ratios of the silicone components A and B were investigated. The provided data is named accordingly:
- Mixing ratio A:B = 1:1 (file 'Dispersion_EI_1184_A1_B1.csv')
- Mixing ratio A:B = 1:0.6 (file 'Dispersion_EI_1184_A1_B06.csv')
- Mixing ratio A:B = 0.6:1 (file 'Dispersion_EI_1184_A06_B1.csv')
All prism-shaped samples were prepared, stored and tested at room temperature. Four measurements were performed for each mixing ratio. The .csv-files are structured in a way that the first measurement corresponds to rows 3-5, the second to rows 6-8, the third to rows 9-11 and the fourth to rows 12-14. In columns A-C, the results of the prism angle _gamma_ (see figure 1) can be found. Column D is empty. Column E labels the measurements of the angles _delta_ (see figure 2), which proceed in columns F-M. In row 2, these columns contain the respective wavelengths of the light source at which the angle measurements are taken. Column N is empty again, and the columns O-V contain the calculated refractive indexes at the respective wavelengths.
The refractice index _n_ is calculated from the measurement data as follows: _n_ = sin((_gamma_ + _delta_)/2) / sin(_gamma_/2)